Message ID | 20230929-ad2s1210-mainline-v3-0-fa4364281745@baylibre.com (mailing list archive) |
---|---|
Headers | show |
Series | iio: resolver: move ad2s1210 out of staging | expand |
On Fri, Sep 29, 2023 at 12:25 PM David Lechner <dlechner@baylibre.com> wrote: > > From: David Lechner <david@lechnology.com> > Ugh, an automated tool picked up my personal email on this for some reason. This extra From: line can be dropped from any patches that get picked up on this round. I will make sure to double-check next time.
On 9/29/23 12:23 PM, David Lechner wrote: > From: David Lechner <david@lechnology.com> > > v3 changes: > > * Added description of A0/A1 lines in DT bindings. > * Added power supply regulators to DT bindings. > * Dropped "staging: iio: Documentation: document IIO resolver AD2S1210 > sysfs attributes" (these attributes are being removed instead). > * Dropped applied patches: > * "staging: iio: resolver: ad2s1210: fix ad2s1210_show_fault" > * "iio: adc: MCP3564: fix the static checker warning" > * Split "staging: iio: resolver: ad2s1210: fix probe" into multiple patches. > * Moved sorting imports to separate patch. > * Renamed fclkin to clkin_hz. > * Added __be16 sample field to state struct for reading raw samples. > * Split out new function ad2s1210_single_conversion() from > ad2s1210_read_raw(). > * Split out new ad2s1210_get_hysteresis() and ad2s1210_set_hysteresis() > functions. > * Fixed multi-line comment style. > * Added notes about soft reset not resetting config registers. > * Made use of FIELD_PREP() macro. > * Added more explanation to regmap commit message. > * Removed datasheet names from channel specs. > * Replaced "staging: iio: resolver: ad2s1210: rename fexcit attribute" > with "staging: iio: resolver: ad2s1210: convert fexcit to channel > attribute". > * Replaced "staging: iio: resolver: ad2s1210: add phase_lock_range > attributes" with "staging: iio: resolver: ad2s1210: add phase lock > range support" > * Added additional patches to convert custom device attributes to event > attributes. > * Added patch to add channel label attributes. > > v2 changes: > * Address initial device tree patch feedback > * Drop "iio: sysfs: add IIO_DEVICE_ATTR_NAMED_RW macro" (related cleanups > also dropped for now, will address in a future series if needed) > * Apply improvements as a series of patches to the staging driver. It is > not quite ready for the move out of staging patch yet. > > This series has been tested on actual hardware using a EVAL-AD2S1210 evaluation > board. (Note: not all device tree features have been implemented in the driver > since the eval board doesn't support them out of the box. We plan to add them > later if needed.) > > Most of the questions about dealing with faults from the v2 cover letter > have been addressed. There is still the question about what to do with > the current `fault` attribute (it is the only custom device attribute > remaining from the original staging driver). It was suggested to split it > out into multiple attributes in a subdirectory. Since we now have events > for all of the faults, I'm wondering if this is something that is still needed. > In the current implementation, it is possible to start listening to events, > clear the faults and then read a sample to trigger events for any current > faults so we have a way to get current faults already. > > There is also the matter of clearing faults. Writing the excitation > frequency has a side-effect of clearing the faults, so we could use > that as the reset. Or we could change the current fault attribute to > write-only and rename it. Or is there a better way that I have overlooked? > > Once this last issue is addressed, I think this driver will be ready > for consideration for moving out of staging. > --- > David Lechner (27): > dt-bindings: iio: resolver: add devicetree bindings for ad2s1210 > staging: iio: resolver: ad2s1210: fix use before initialization > staging: iio: resolver: ad2s1210: remove call to spi_setup() > staging: iio: resolver: ad2s1210: check return of ad2s1210_initial() > staging: iio: resolver: ad2s1210: remove spi_set_drvdata() > staging: iio: resolver: ad2s1210: sort imports > staging: iio: resolver: ad2s1210: always use 16-bit value for raw read > staging: iio: resolver: ad2s1210: implement IIO_CHAN_INFO_SCALE > staging: iio: resolver: ad2s1210: use devicetree to get CLKIN rate > staging: iio: resolver: ad2s1210: use regmap for config registers > staging: iio: resolver: ad2s1210: add debugfs reg access > staging: iio: resolver: ad2s1210: remove config attribute > staging: iio: resolver: ad2s1210: rework gpios > staging: iio: resolver: ad2s1210: implement hysteresis as channel attr > staging: iio: resolver: ad2s1210: refactor setting excitation frequency > staging: iio: resolver: ad2s1210: read excitation frequency from control register > staging: iio: resolver: ad2s1210: convert fexcit to channel attribute > staging: iio: resolver: ad2s1210: convert resolution to devicetree property > staging: iio: resolver: ad2s1210: add phase lock range support > staging: iio: resolver: ad2s1210: add triggered buffer support > staging: iio: resolver: ad2s1210: convert LOT threshold attrs to event attrs > staging: iio: resolver: ad2s1210: convert LOS threshold to event attr > staging: iio: resolver: ad2s1210: convert DOS overrange threshold to event attr > staging: iio: resolver: ad2s1210: convert DOS mismatch threshold to event attr > staging: iio: resolver: ad2s1210: rename DOS reset min/max attrs > staging: iio: resolver: ad2s1210: implement fault events > staging: iio: resolver: ad2s1210: add label attribute support > > .../bindings/iio/resolver/adi,ad2s1210.yaml | 177 +++ > .../Documentation/sysfs-bus-iio-resolver-ad2s1210 | 27 + > drivers/staging/iio/resolver/Kconfig | 1 + > drivers/staging/iio/resolver/ad2s1210.c | 1583 +++++++++++++++----- > 4 files changed, 1391 insertions(+), 397 deletions(-) > --- > base-commit: 5e99f692d4e32e3250ab18d511894ca797407aec > change-id: 20230925-ad2s1210-mainline-2791ef75e386 > In the end, this is what sysfs looks like: root@analog:~# tree /sys/bus/iio/devices/iio\:device1/ /sys/bus/iio/devices/iio:device1/ ├── buffer │ ├── data_available │ ├── direction │ ├── enable │ ├── length │ └── watermark ├── buffer0 │ ├── data_available │ ├── direction │ ├── enable │ ├── in_angl0_en │ ├── in_angl0_index │ ├── in_angl0_type │ ├── in_anglvel0_en │ ├── in_anglvel0_index │ ├── in_anglvel0_type │ ├── in_timestamp_en │ ├── in_timestamp_index │ ├── in_timestamp_type │ ├── length │ └── watermark ├── current_timestamp_clock ├── dev ├── events │ ├── in_altvoltage0_mag_reset_max │ ├── in_altvoltage0_mag_reset_max_available │ ├── in_altvoltage0_mag_reset_min │ ├── in_altvoltage0_mag_reset_min_available │ ├── in_altvoltage0_mag_value │ ├── in_altvoltage0_mag_value_available │ ├── in_altvoltage0_thresh_falling_value │ ├── in_altvoltage0_thresh_falling_value_available │ ├── in_altvoltage0_thresh_rising_value │ ├── in_altvoltage0_thresh_rising_value_available │ ├── in_angl1_thresh_rising_hysteresis │ ├── in_angl1_thresh_rising_hysteresis_available │ ├── in_angl1_thresh_rising_value │ ├── in_angl1_thresh_rising_value_available │ ├── in_phase0_mag_value │ └── in_phase0_mag_value_available ├── fault ├── in_altvoltage0_label ├── in_altvoltage1_x_label ├── in_altvoltage1_y_label ├── in_angl0_hysteresis ├── in_angl0_hysteresis_available ├── in_angl0_label ├── in_angl0_raw ├── in_angl0_scale ├── in_angl1_label ├── in_anglvel0_label ├── in_anglvel0_raw ├── in_anglvel0_scale ├── in_phase0_label ├── name ├── of_node -> ../../../../../../../../firmware/devicetree/base/axi/spi@e0006000/ad2s1210@0 ├── out_altvoltage0_frequency ├── out_altvoltage0_frequency_available ├── out_altvoltage0_label ├── power │ ├── autosuspend_delay_ms │ ├── control │ ├── runtime_active_time │ ├── runtime_status │ └── runtime_suspended_time ├── scan_elements │ ├── in_angl0_en │ ├── in_angl0_index │ ├── in_angl0_type │ ├── in_anglvel0_en │ ├── in_anglvel0_index │ ├── in_anglvel0_type │ ├── in_timestamp_en │ ├── in_timestamp_index │ └── in_timestamp_type ├── subsystem -> ../../../../../../../../bus/iio ├── trigger │ └── current_trigger ├── uevent └── waiting_for_supplier 8 directories, 72 files And this is what the output of iio_info looks like: (note: iio_info does not currently support events so those attributes are not visible here) iio:device1: ad2s1210 (buffer capable) 9 channels found: angl0: (input, index: 0, format: be:U16/16>>0) 5 channel-specific attributes found: attr 0: hysteresis value: 1 attr 1: hysteresis_available value: 0 1 attr 2: label value: position attr 3: raw value: 12578 attr 4: scale value: 0.000095874 anglvel0: (input, index: 1, format: be:S16/16>>0) 3 channel-specific attributes found: attr 0: label value: velocity attr 1: raw value: 5 attr 2: scale value: 0.023968449 timestamp: (input, index: 2, format: le:S64/64>>0) phase0: (input) 1 channel-specific attributes found: attr 0: label value: synthetic reference altvoltage0: (output) 3 channel-specific attributes found: attr 0: frequency value: 10000 attr 1: frequency_available value: [2000 250 20000] attr 2: label value: excitation angl1: (input) 1 channel-specific attributes found: attr 0: label value: tracking error altvoltage1_y: (input) 1 channel-specific attributes found: attr 0: label value: sine altvoltage0: (input) 1 channel-specific attributes found: attr 0: label value: monitor signal altvoltage1_x: (input) 1 channel-specific attributes found: attr 0: label value: cosine 3 device-specific attributes found: attr 0: current_timestamp_clock value: realtime attr 1: fault value: 0x00 attr 2: waiting_for_supplier value: 0 2 buffer-specific attributes found: attr 0: data_available value: 0 attr 1: direction value: in 1 debug attributes found: debug attr 0: direct_reg_access ERROR: Input/output error (5) Current trigger: trigger0(test)
On Fri, 29 Sep 2023 12:49:42 -0500 David Lechner <dlechner@baylibre.com> wrote: > On Fri, Sep 29, 2023 at 12:25 PM David Lechner <dlechner@baylibre.com> wrote: > > > > From: David Lechner <david@lechnology.com> > > > > Ugh, an automated tool picked up my personal email on this for some > reason. This extra From: line can be dropped from any patches that get > picked up on this round. I will make sure to double-check next time. Seems b4 picks up the second, correct From anyway which is handy ;) Jonathan
From: David Lechner <david@lechnology.com> v3 changes: * Added description of A0/A1 lines in DT bindings. * Added power supply regulators to DT bindings. * Dropped "staging: iio: Documentation: document IIO resolver AD2S1210 sysfs attributes" (these attributes are being removed instead). * Dropped applied patches: * "staging: iio: resolver: ad2s1210: fix ad2s1210_show_fault" * "iio: adc: MCP3564: fix the static checker warning" * Split "staging: iio: resolver: ad2s1210: fix probe" into multiple patches. * Moved sorting imports to separate patch. * Renamed fclkin to clkin_hz. * Added __be16 sample field to state struct for reading raw samples. * Split out new function ad2s1210_single_conversion() from ad2s1210_read_raw(). * Split out new ad2s1210_get_hysteresis() and ad2s1210_set_hysteresis() functions. * Fixed multi-line comment style. * Added notes about soft reset not resetting config registers. * Made use of FIELD_PREP() macro. * Added more explanation to regmap commit message. * Removed datasheet names from channel specs. * Replaced "staging: iio: resolver: ad2s1210: rename fexcit attribute" with "staging: iio: resolver: ad2s1210: convert fexcit to channel attribute". * Replaced "staging: iio: resolver: ad2s1210: add phase_lock_range attributes" with "staging: iio: resolver: ad2s1210: add phase lock range support" * Added additional patches to convert custom device attributes to event attributes. * Added patch to add channel label attributes. v2 changes: * Address initial device tree patch feedback * Drop "iio: sysfs: add IIO_DEVICE_ATTR_NAMED_RW macro" (related cleanups also dropped for now, will address in a future series if needed) * Apply improvements as a series of patches to the staging driver. It is not quite ready for the move out of staging patch yet. This series has been tested on actual hardware using a EVAL-AD2S1210 evaluation board. (Note: not all device tree features have been implemented in the driver since the eval board doesn't support them out of the box. We plan to add them later if needed.) Most of the questions about dealing with faults from the v2 cover letter have been addressed. There is still the question about what to do with the current `fault` attribute (it is the only custom device attribute remaining from the original staging driver). It was suggested to split it out into multiple attributes in a subdirectory. Since we now have events for all of the faults, I'm wondering if this is something that is still needed. In the current implementation, it is possible to start listening to events, clear the faults and then read a sample to trigger events for any current faults so we have a way to get current faults already. There is also the matter of clearing faults. Writing the excitation frequency has a side-effect of clearing the faults, so we could use that as the reset. Or we could change the current fault attribute to write-only and rename it. Or is there a better way that I have overlooked? Once this last issue is addressed, I think this driver will be ready for consideration for moving out of staging. --- David Lechner (27): dt-bindings: iio: resolver: add devicetree bindings for ad2s1210 staging: iio: resolver: ad2s1210: fix use before initialization staging: iio: resolver: ad2s1210: remove call to spi_setup() staging: iio: resolver: ad2s1210: check return of ad2s1210_initial() staging: iio: resolver: ad2s1210: remove spi_set_drvdata() staging: iio: resolver: ad2s1210: sort imports staging: iio: resolver: ad2s1210: always use 16-bit value for raw read staging: iio: resolver: ad2s1210: implement IIO_CHAN_INFO_SCALE staging: iio: resolver: ad2s1210: use devicetree to get CLKIN rate staging: iio: resolver: ad2s1210: use regmap for config registers staging: iio: resolver: ad2s1210: add debugfs reg access staging: iio: resolver: ad2s1210: remove config attribute staging: iio: resolver: ad2s1210: rework gpios staging: iio: resolver: ad2s1210: implement hysteresis as channel attr staging: iio: resolver: ad2s1210: refactor setting excitation frequency staging: iio: resolver: ad2s1210: read excitation frequency from control register staging: iio: resolver: ad2s1210: convert fexcit to channel attribute staging: iio: resolver: ad2s1210: convert resolution to devicetree property staging: iio: resolver: ad2s1210: add phase lock range support staging: iio: resolver: ad2s1210: add triggered buffer support staging: iio: resolver: ad2s1210: convert LOT threshold attrs to event attrs staging: iio: resolver: ad2s1210: convert LOS threshold to event attr staging: iio: resolver: ad2s1210: convert DOS overrange threshold to event attr staging: iio: resolver: ad2s1210: convert DOS mismatch threshold to event attr staging: iio: resolver: ad2s1210: rename DOS reset min/max attrs staging: iio: resolver: ad2s1210: implement fault events staging: iio: resolver: ad2s1210: add label attribute support .../bindings/iio/resolver/adi,ad2s1210.yaml | 177 +++ .../Documentation/sysfs-bus-iio-resolver-ad2s1210 | 27 + drivers/staging/iio/resolver/Kconfig | 1 + drivers/staging/iio/resolver/ad2s1210.c | 1583 +++++++++++++++----- 4 files changed, 1391 insertions(+), 397 deletions(-) --- base-commit: 5e99f692d4e32e3250ab18d511894ca797407aec change-id: 20230925-ad2s1210-mainline-2791ef75e386