@@ -1224,6 +1224,11 @@ static int nfit_test_ctl(struct nvdimm_bus_descriptor *nd_desc,
i = get_dimm(nfit_mem, func);
if (i < 0)
return i;
+ if (i >= NUM_DCR) {
+ dev_WARN_ONCE(&t->pdev.dev, 1,
+ "ND_CMD_CALL only valid for nfit_test0\n");
+ return -EINVAL;
+ }
switch (func) {
case NVDIMM_INTEL_GET_SECURITY_STATE:
@@ -1252,11 +1257,11 @@ static int nfit_test_ctl(struct nvdimm_bus_descriptor *nd_desc,
break;
case NVDIMM_INTEL_OVERWRITE:
rc = nd_intel_test_cmd_overwrite(t,
- buf, buf_len, i - t->dcr_idx);
+ buf, buf_len, i);
break;
case NVDIMM_INTEL_QUERY_OVERWRITE:
rc = nd_intel_test_cmd_query_overwrite(t,
- buf, buf_len, i - t->dcr_idx);
+ buf, buf_len, i);
break;
case NVDIMM_INTEL_SET_MASTER_PASSPHRASE:
rc = nd_intel_test_cmd_master_set_pass(t,
@@ -1272,48 +1277,45 @@ static int nfit_test_ctl(struct nvdimm_bus_descriptor *nd_desc,
break;
case ND_INTEL_FW_GET_INFO:
rc = nd_intel_test_get_fw_info(t, buf,
- buf_len, i - t->dcr_idx);
+ buf_len, i);
break;
case ND_INTEL_FW_START_UPDATE:
rc = nd_intel_test_start_update(t, buf,
- buf_len, i - t->dcr_idx);
+ buf_len, i);
break;
case ND_INTEL_FW_SEND_DATA:
rc = nd_intel_test_send_data(t, buf,
- buf_len, i - t->dcr_idx);
+ buf_len, i);
break;
case ND_INTEL_FW_FINISH_UPDATE:
rc = nd_intel_test_finish_fw(t, buf,
- buf_len, i - t->dcr_idx);
+ buf_len, i);
break;
case ND_INTEL_FW_FINISH_QUERY:
rc = nd_intel_test_finish_query(t, buf,
- buf_len, i - t->dcr_idx);
+ buf_len, i);
break;
case ND_INTEL_SMART:
rc = nfit_test_cmd_smart(buf, buf_len,
- &t->smart[i - t->dcr_idx]);
+ &t->smart[i]);
break;
case ND_INTEL_SMART_THRESHOLD:
rc = nfit_test_cmd_smart_threshold(buf,
buf_len,
- &t->smart_threshold[i -
- t->dcr_idx]);
+ &t->smart_threshold[i]);
break;
case ND_INTEL_SMART_SET_THRESHOLD:
rc = nfit_test_cmd_smart_set_threshold(buf,
buf_len,
- &t->smart_threshold[i -
- t->dcr_idx],
- &t->smart[i - t->dcr_idx],
+ &t->smart_threshold[i],
+ &t->smart[i],
&t->pdev.dev, t->dimm_dev[i]);
break;
case ND_INTEL_SMART_INJECT:
rc = nfit_test_cmd_smart_inject(buf,
buf_len,
- &t->smart_threshold[i -
- t->dcr_idx],
- &t->smart[i - t->dcr_idx],
+ &t->smart_threshold[i],
+ &t->smart[i],
&t->pdev.dev, t->dimm_dev[i]);
break;
default:
The ND_CMD_CALL path only applies to the nfit_test0 emulated DIMMs. Cleanup occurrences of (i - t->dcr_idx) since that offset fixup only applies to cases where nfit_test1 needs a bus-local index. Signed-off-by: Dan Williams <dan.j.williams@intel.com> --- tools/testing/nvdimm/test/nfit.c | 34 ++++++++++++++++++---------------- 1 file changed, 18 insertions(+), 16 deletions(-)