@@ -488,9 +488,6 @@ static int hisi_thermal_register_sensor(struct platform_device *pdev,
return ret;
}
- thermal_zone_device_toggle(sensor->tzd, true);
- thermal_zone_device_check(sensor->tzd);
-
trip = of_thermal_get_trip_points(sensor->tzd);
for (i = 0; i < of_thermal_get_ntrips(sensor->tzd); i++) {
@@ -553,6 +550,9 @@ static int hisi_thermal_probe(struct platform_device *pdev)
return ret;
}
+ thermal_zone_device_toggle((&data->sensor)->tzd, true);
+ thermal_zone_device_check((&data->sensor)->tzd);
+
if (data->irq) {
ret = devm_request_threaded_irq(dev, data->irq, NULL,
hisi_thermal_alarm_irq_thread,
@@ -563,9 +563,6 @@ static int hisi_thermal_probe(struct platform_device *pdev)
}
}
- thermal_zone_device_toggle((&data->sensor)->tzd, true);
- thermal_zone_device_check((&data->sensor)->tzd);
-
return 0;
}
* Enable/check sensor after checking ntrips and doing chipset specific enable operation. * Remove superfluous second sensor enable/check attempt. Signed-off-by: Bartlomiej Zolnierkiewicz <b.zolnierkie@samsung.com> --- drivers/thermal/hisi_thermal.c | 9 +++------ 1 file changed, 3 insertions(+), 6 deletions(-)