@@ -62,6 +62,8 @@
#define SC27XX_FGU_CUR_BASIC_ADC 8192
#define SC27XX_FGU_SAMPLE_HZ 2
+/* micro Ohms */
+#define SC27XX_FGU_IDEAL_RESISTANCE 20000
/*
* struct sc27xx_fgu_data: describe the FGU device
@@ -84,6 +86,7 @@
* @resist_table_len: the resistance table length
* @cur_1000ma_adc: ADC value corresponding to 1000 mA
* @vol_1000mv_adc: ADC value corresponding to 1000 mV
+ * @calib_resist: the real resistance of coulomb counter chip in mOhm
* @cap_table: capacity table with corresponding ocv
* @resist_table: resistance percent table with corresponding temperature
*/
@@ -108,6 +111,7 @@ struct sc27xx_fgu_data {
int resist_table_len;
int cur_1000ma_adc;
int vol_1000mv_adc;
+ int calib_resist;
struct power_supply_battery_ocv_table *cap_table;
struct power_supply_resistance_temp_table *resist_table;
};
@@ -900,7 +904,9 @@ static int sc27xx_fgu_calibration(struct sc27xx_fgu_data *data)
*/
cal_4200mv = (calib_data & 0x1ff) + 6963 - 4096 - 256;
data->vol_1000mv_adc = DIV_ROUND_CLOSEST(cal_4200mv * 10, 42);
- data->cur_1000ma_adc = data->vol_1000mv_adc * 4;
+ data->cur_1000ma_adc =
+ DIV_ROUND_CLOSEST(data->vol_1000mv_adc * 4 * data->calib_resist,
+ SC27XX_FGU_IDEAL_RESISTANCE);
kfree(buf);
return 0;
@@ -1079,6 +1085,15 @@ static int sc27xx_fgu_probe(struct platform_device *pdev)
return ret;
}
+ ret = device_property_read_u32(&pdev->dev,
+ "sprd,calib-resistance-micro-ohms",
+ &data->calib_resist);
+ if (ret) {
+ dev_err(&pdev->dev,
+ "failed to get fgu calibration resistance\n");
+ return ret;
+ }
+
data->channel = devm_iio_channel_get(dev, "bat-temp");
if (IS_ERR(data->channel)) {
dev_err(dev, "failed to get IIO channel\n");